Título
Termination of hollow core nanopipes in GaN by an AlN interlayer
11627/503711627/5037
Autor
Contreras López, Oscar Edel
Ruíz Zepeda, Francisco
Ávalos Borja, Miguel
Dadgar, Armin
Krost, Alois
Resumen
"Nanopipes associated to screw dislocations are studied by transmission electron microscopy in Si-doped GaN films grown on silicon substrates. The observations revealed that dislocations had an empty core and that an AlN interlayer is suited to block their propagation. The termination mechanism is discussed in terms of strain and kinetic growth factors, which may affect the creation and propagation of nanopipes. According to the observations, it is proposed that either step pinning or lateral overgrowth occurring at the proximity of the defect assists in capping the nanopipe."
Fecha de publicación
2016Tipo de publicación
articleDOI
https://doi.org/10.1016/j.jcrysgro.2016.09.027Área de conocimiento
FÍSICAEditor
ElsevierPalabras clave
NanostructuresTEM
Nanopipes
Metal Organic Vapor Phase Epitaxy
GaN
Semiconducting III-V materials