• Complex refractive index of InXGa1-XN thin films grown on cubic (100) GaN/MgO 

      Vilchis, Heber; Compeán García, Vicente Damián; Orozco Hinostroza, Ignacio Everardo; López Luna, Edgar; Vidal Borbolla, Miguel Ángel; Rodríguez Vázquez, Angel Gabriel (Elsevier, 2017)
      "Spectroscopic ellipsometry measurements of InXGa1-XN thin films were carried out in the photon energy range from 0.6 to 4.75 eV. The samples were grown on cubic GaN/MgO (100) template substrates by plasma assisted molecular ...