Browsing División de Nanociencias y Materiales by Subject "Ellipsometry"
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Complex refractive index of InXGa1-XN thin films grown on cubic (100) GaN/MgO
(Elsevier, 2017)"Spectroscopic ellipsometry measurements of InXGa1-XN thin films were carried out in the photon energy range from 0.6 to 4.75 eV. The samples were grown on cubic GaN/MgO (100) template substrates by plasma assisted molecular ...