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Effect of an electric field within microscopy focused ion beam (FIB) between manipulator sharp and the ion trap of the electron detector

Gómez, Jorge Alberto; Pérez Hernández, Antonio; Duarte Moller, José Alberto (2011)

"The manipulation of samples with micro manipulators sharps in the normal axis to the observation plane is practically blind in microscopy focused ion beam (FIB) mono beam. The application of a negative potential to the ...